Ключевые слова: chalcogenide, electrodeposition, films, fabrication, voltage, X-ray diffraction, microstructure, experimental results
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Piperno L., Masi A., Cialone M., Iebole M., Botti S., Bonfigli F., Savio L.
Rufoloni A., Celentano G., Rizzo F., Augieri A., Pompeo N., Masi A., Barba L., Duchenko A., Varsano F.
Zenobio A.D., Chiarelli S., Rufoloni A., Vannozzi A., Turtu S., Celentano G., Augieri A., Muzzi L., Marzi G.D., Corte A.D., Messina G., Bragagni A., Seri M., Anemona A., Marchetti M., Formichetti A., Masi A., Giannini L., Arabi M.
Ключевые слова: fusion magnets, Al, Cu-based conductors, cable-in-conduit conductor, HTS, REBCO, coated conductors, tapes, stacked blocks, twisting, design, mechanical properties, strain effects, distribution, bending radius, critical current, current-voltage characteristics, resistance, numerical analysis
Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Ciccioli A., Augieri A., Armenio A.A., Masi A., Barba L., Duchenko A., Varsano F., Plaisier J.R., Gigli L.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Rizzo F., Augieri A., Armenio A.A., Martinelli A., Sotgiu G., Meledin A., Pinto V., Piperno L., Manca N., Cialone M., Iebole M.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Campagna E., Salvato M.
Rufoloni A., Vannozzi A., Celentano G., Augieri A., Corte A., Armenio A.A., Masi A., Duchenko A., Varsano F.
Rufoloni A., Muzzi L., Bordini B., Marzi G.D., Corte A.D., Affinito L., Armenio A.A., Freda R., Formichetti A., Baffari D., Merli L.
Mancini A., Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Meledin A., Pinto V., Feighan J., Mayer J.
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, nanodoping, nanoscaled effects, PLD process, pinning centers artificial, microstructure, X-ray diffraction, lattice parameter, critical temperature, critical caracteristics, Jc/B curves, growth rate, pinning force, temperature dependence, critical current density, angular dependence, fabrication, experimental results
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor JrT.
Ключевые слова: HTS, YBCO, films, template layers, substrate SrTiO3, nanoscaled effects, microstructure, critical caracteristics, critical current density, fabrication, MOD process, surface, pinning centers artificial, X-ray diffraction, Jc/B curves, angular dependence, pinning force, lattice parameter, magnetic field dependence, experimental results
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L., Santoni A., Rondino F., Tortora L.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Pompeo N., Angrisani A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Santoni A., Rondino F.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., jr T.P.
Zenobio A.D., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Augieri A., Muzzi L., Marzi G.D., Corte A.D., Marchetti M.
Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Tendeloo G.V., Pompeo N., Silva E., Torokhtii K., Meledin A., Frolova A., Armenio1 A.A., Mancini1 A., Pinto1 V., Feighan J., Celentano1 G., Rizzo1 F., Augieri1 A.
Ключевые слова: presentation, HTS, YBCO, films, films epitaxial, doping effect, nanoscaled effects, PLD process, pinning centers artificial, pinning force, density, magnetic field dependence, critical caracteristics, Jc/B curves, microstructure, defects columnar, critical current density, angular dependence, resistive transition, X-ray diffraction, temperature dependence, growth rate, experimental results
Ключевые слова: coated conductors, fabrication, substrate Ni-W, buffer layers, texture, chemical solution deposition
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